March 6, 2021

Download Ebook Free Architecture Design For Soft Errors

Architecture Design for Soft Errors

Architecture Design for Soft Errors
Author : Shubu Mukherjee
Publisher : Morgan Kaufmann
Release Date : 2011-08-29
Category : Computers
Total pages :360
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Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors Shows readers how to quantify their soft error reliability Provides state-of-the-art techniques to protect against soft errors

Soft Errors

Soft Errors
Author : Jean-Luc Autran,Daniela Munteanu
Publisher : CRC Press
Release Date : 2017-12-19
Category : Technology & Engineering
Total pages :439
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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Soft Error Reliability of VLSI Circuits

Soft Error Reliability of VLSI Circuits
Author : Behnam Ghavami,Mohsen Raji
Publisher : Springer Nature
Release Date : 2020-11-14
Category : Technology & Engineering
Total pages :114
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This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Soft Errors

Soft Errors
Author : Jean-Luc Autran,Daniela Munteanu
Publisher : CRC Press
Release Date : 2015-02-25
Category : Technology & Engineering
Total pages :439
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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

FPGAs and Parallel Architectures for Aerospace Applications

FPGAs and Parallel Architectures for Aerospace Applications
Author : Fernanda Kastensmidt,Paolo Rech
Publisher : Springer
Release Date : 2015-12-07
Category : Technology & Engineering
Total pages :325
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This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Soft Error Reliability Using Virtual Platforms

Soft Error Reliability Using Virtual Platforms
Author : Felipe Rocha da Rosa
Publisher : Springer Nature
Release Date : 2021
Category :
Total pages :129
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Fault Tolerant Computer Architecture

Fault Tolerant Computer Architecture
Author : Daniel Sorin
Publisher : Morgan & Claypool Publishers
Release Date : 2009-07-08
Category : Technology & Engineering
Total pages :104
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For many years, most computer architects have pursued one primary goal: performance. Architects have translated the ever-increasing abundance of ever-faster transistors provided by Moore's law into remarkable increases in performance. Recently, however, the bounty provided by Moore's law has been accompanied by several challenges that have arisen as devices have become smaller, including a decrease in dependability due to physical faults. In this book, we focus on the dependability challenge and the fault tolerance solutions that architects are developing to overcome it. The two main purposes of this book are to explore the key ideas in fault-tolerant computer architecture and to present the current state-of-the-art - over approximately the past 10 years - in academia and industry. Table of Contents: Introduction / Error Detection / Error Recovery / Diagnosis / Self-Repair / The Future

Resilient Architecture Design for Voltage Variation

Resilient Architecture Design for Voltage Variation
Author : Vijay Janapa Reddi,Meeta Sharma Gupta
Publisher : Morgan & Claypool Publishers
Release Date : 2013-05-01
Category : Computers
Total pages :138
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Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructs that can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency

Dependability in Electronic Systems

Dependability in Electronic Systems
Author : Nobuyasu Kanekawa,Eishi H. Ibe,Takashi Suga,Yutaka Uematsu
Publisher : Springer Science & Business Media
Release Date : 2010-11-08
Category : Technology & Engineering
Total pages :204
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This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.

Computer Organization and Design

Computer Organization and Design
Author : David A. Patterson,John L. Hennessy
Publisher : Elsevier
Release Date : 2004-08-07
Category : Computers
Total pages :656
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This best selling text on computer organization has been thoroughly updated to reflect the newest technologies. Examples highlight the latest processor designs, benchmarking standards, languages and tools. As with previous editions, a MIPs processor is the core used to present the fundamentals of hardware technologies at work in a computer system. The book presents an entire MIPS instruction set—instruction by instruction—the fundamentals of assembly language, computer arithmetic, pipelining, memory hierarchies and I/O. A new aspect of the third edition is the explicit connection between program performance and CPU performance. The authors show how hardware and software components--such as the specific algorithm, programming language, compiler, ISA and processor implementation--impact program performance. Throughout the book a new feature focusing on program performance describes how to search for bottlenecks and improve performance in various parts of the system. The book digs deeper into the hardware/software interface, presenting a complete view of the function of the programming language and compiler--crucial for understanding computer organization. A CD provides a toolkit of simulators and compilers along with tutorials for using them. For instructor resources click on the grey "companion site" button found on the right side of this page. This new edition represents a major revision. New to this edition: * Entire Text has been updated to reflect new technology * 70% new exercises. * Includes a CD loaded with software, projects and exercises to support courses using a number of tools * A new interior design presents defined terms in the margin for quick reference * A new feature, "Understanding Program Performance" focuses on performance from the programmer's perspective * Two sets of exercises and solutions, "For More Practice" and "In More Depth," are included on the CD * "Check Yourself" questions help students check their understanding of major concepts * "Computers In the Real World" feature illustrates the diversity of uses for information technology *More detail below...

VLSI-SoC: Research Trends in VLSI and Systems on Chip

VLSI-SoC: Research Trends in VLSI and Systems on Chip
Author : Giovanni De Micheli,Salvador Mir,Ricardo Reis
Publisher : Springer
Release Date : 2010-08-23
Category : Computers
Total pages :394
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This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.

Design of Soft Error Robust High Speed 64-bit Logarithmic Adder

Design of Soft Error Robust High Speed 64-bit Logarithmic Adder
Author : Jaspal Singh Shah
Publisher : Unknown
Release Date : 2008
Category :
Total pages :55
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Continuous scaling of the transistor size and reduction of the operating voltage have led to a significant performance improvement of integrated circuits. However, the vulnerability of the scaled circuits to transient data upsets or soft errors, which are caused by alpha particles and cosmic neutrons, has emerged as a major reliability concern. In this thesis, we have investigated the effects of soft errors in combinational circuits and proposed soft error detection techniques for high speed adders. In particular, we have proposed an area-efficient 64-bit soft error robust logarithmic adder (SRA). The adder employs the carry merge Sklansky adder architecture in which carries are generated every 4 bits. Since the particle-induced transient, which is often referred to as a single event transient (SET) typically lasts for 100~200 ps, the adder uses time redundancy by sampling the sum outputs twice.

Achieving High Availability with Commodity Hardware and Software

Achieving High Availability with Commodity Hardware and Software
Author : Nidhi Aggarwal
Publisher : Unknown
Release Date : 2008
Category :
Total pages :118
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Software Architecture in Practice

Software Architecture in Practice
Author : Len Bass,Paul Clements,Rick Kazman
Publisher : Addison-Wesley Professional
Release Date : 2003
Category : Computers
Total pages :528
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This is the eagerly-anticipated revision to one of the seminal books in the field of software architecture which clearly defines and explains the topic.

Fowler

Fowler
Author : Martin Fowler
Publisher : Addison-Wesley
Release Date : 2012-03-09
Category : Computers
Total pages :557
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The practice of enterprise application development has benefited from the emergence of many new enabling technologies. Multi-tiered object-oriented platforms, such as Java and .NET, have become commonplace. These new tools and technologies are capable of building powerful applications, but they are not easily implemented. Common failures in enterprise applications often occur because their developers do not understand the architectural lessons that experienced object developers have learned. Patterns of Enterprise Application Architecture is written in direct response to the stiff challenges that face enterprise application developers. The author, noted object-oriented designer Martin Fowler, noticed that despite changes in technology--from Smalltalk to CORBA to Java to .NET--the same basic design ideas can be adapted and applied to solve common problems. With the help of an expert group of contributors, Martin distills over forty recurring solutions into patterns. The result is an indispensable handbook of solutions that are applicable to any enterprise application platform. This book is actually two books in one. The first section is a short tutorial on developing enterprise applications, which you can read from start to finish to understand the scope of the book's lessons. The next section, the bulk of the book, is a detailed reference to the patterns themselves. Each pattern provides usage and implementation information, as well as detailed code examples in Java or C#. The entire book is also richly illustrated with UML diagrams to further explain the concepts. Armed with this book, you will have the knowledge necessary to make important architectural decisions about building an enterprise application and the proven patterns for use when building them. The topics covered include · Dividing an enterprise application into layers · The major approaches to organizing business logic · An in-depth treatment of mapping between objects and relational databases · Using Model-View-Controller to organize a Web presentation · Handling concurrency for data that spans multiple transactions · Designing distributed object interfaces