November 25, 2020

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On-Wafer Microwave Measurements and De-embedding

On-Wafer Microwave Measurements and De-embedding
Author : Errikos Lourandakis
Publisher : Artech House
Release Date : 2016-07-31
Category : Technology & Engineering
Total pages :256
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This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.

Microwave De-embedding

Microwave De-embedding
Author : Giovanni Crupi,Dominique Schreurs
Publisher : Academic Press
Release Date : 2013-11-09
Category : Technology & Engineering
Total pages :480
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This groundbreaking book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies. With this book you will learn: The theoretical background of high-frequency de-embedding for measurements, modelling, and design Details on applying the de-embedding concept to the transistor’s linear, non-linear, and noise behaviour The impact of de-embedding on low-noise and power amplifier design The recent advances and future trends in the field of high-frequency de-embedding Presents the theory and practice of microwave de-embedding, from the basic principles to recent advances and future trends Written by experts in the field, all of whom are leading researchers in the area Each chapter describes theoretical background and gives experimental results and practical applications Includes forewords by Giovanni Ghione and Stephen Maas

Microwave De-embedding

Microwave De-embedding
Author : Giovanni Crupi,Dominique M.M.-P. Schreurs,Alina Caddemi
Publisher : Elsevier Inc. Chapters
Release Date : 2013-11-09
Category : Technology & Engineering
Total pages :480
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The first chapter is intended primarily for those readers who are new to the de-embedding concept. To serve as a gateway into this fascinating but also challenging field of knowledge, the present chapter will show how to extract the full potential of the microwave de-embedding concept, from the theoretical background to practical applications. As a broad definition, de-embedding can be regarded as the mathematical process by which electrical reference planes can be set to desired locations. Its importance originates from the fact that electrical characteristics are not always directly measurable at the reference planes of interest. Hence, moving the electrical reference planes mathematically enables one to discover precious information. With the aim to provide an introductory and comprehensive overview of the de-embedding concept, this chapter discusses its effectiveness for different purposes: measurements, modeling, and design. Experimental results will be analyzed to act as a valuable support for gaining a clear-cut understanding.

Microwave De-embedding

Microwave De-embedding
Author : Gilles Dambrine
Publisher : Elsevier Inc. Chapters
Release Date : 2013-11-09
Category : Technology & Engineering
Total pages :480
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This chapter aims to describe experimental tools and techniques used for on-wafer millimeter (mm)-wave characterizations of silicon-based devices under the small-signal regime. We discuss the basics of scattering parameters (S parameters), high-frequency (HF) noise concept and measurement facilities, and expert details concerning experimental procedures. In this chapter, we describe first the basic notions of the S-parameters concept and its limitations, as well of as those HF noise. Secondly, the main experimental tools such as mm-wave vectorial network analyzer, noise setup, and on-wafer station are depicted. The third part concerns the description and the methodology of on-wafer calibration and de-embedding techniques applied for mm-wave advanced silicon devices. Finally, the last section focuses on the presentation and description of several examples of device characterizations. The main objective of this chapter is to propose a tradeoff between basic information and details of experience.

On-Wafer Microwave De-Embedding Techniques

On-Wafer Microwave De-Embedding Techniques
Author : Xi Sung Loo
Publisher : Unknown
Release Date : 2017
Category : Technology
Total pages :129
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Wireless communication technology has kept evolving into higher frequency regime to take advantage of wider data bandwidth and higher speed performance. Successful RF circuit design requires accurate characterization of on-chip devices. This greatly relies on robust de-embedding technique to completely remove surrounding parasitics of pad and interconnects that connect device to measurement probes. Complex interaction of fixture parasitic at high frequency has imposed extreme challenges to de-embedding particularly for lossy complementary metal oxide semiconductor (CMOS) device. A generalized network de-embedding technique that avoids any inaccurate lumped and transmission line assumptions on the pad and interconnects of the test structure is presented. The de-embedding strategy has been validated by producing negligible de-embedding error (

Microwave De-embedding

Microwave De-embedding
Author : Manuel Yarlequé,Dominique M.M.-P. Schreurs,Bart Nauwelaers,Davide Resca,Giorgio Vannini
Publisher : Elsevier Inc. Chapters
Release Date : 2013-11-09
Category : Technology & Engineering
Total pages :480
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This chapter aims to describe methodologies and techniques for de-embedding device measurements from extrinsic measurements by characterizing the parasitic network surrounding the intrinsic device, through the use of a three-dimensional (3D) physical model of the network and its electromagnetic (EM) analysis. The electromagnetic behavior is obtained employing 3D EM solvers and internal ports. In the first part, the de-embedding processes for field-effect transistor (FET) devices to be used for monolithic microwave integrated circuit designs are studied by four different approaches; in the second part of this chapter, the de-embedding of FET devices for hybrid circuit design purposes is described.

Microwave De-embedding

Microwave De-embedding
Author : James C. Rautio
Publisher : Elsevier Inc. Chapters
Release Date : 2013-11-09
Category : Technology & Engineering
Total pages :480
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Just as physical microwave measurements must be de-embedded from test fixtures by means of calibration, electromagnetic analysis must likewise be calibrated so the results may be de-embedded. This chapter investigates the nature of the electromagnetic analysis port discontinuity, how it is characterized by calibration, and how it is removed (including a possible reference plane shift) by de-embedding. Both double-delay and short-open calibration are described. The theory for single port calibration and de-embedding is presented in a manner that is easily extended to treat multiple coupled ports. Additional theory shows how to extend calibration to groups of internal ports, critical, for example, in analyzing the passive planar portion of an amplifier (both the input and output matching networks in the same analysis) and having internal calibrated ports for connecting the transistor. Evaluation of error (accuracy) is covered in detail. Techniques that take advantage of calibrated ports, including circuit subdivision and port tuning, are described.

Handbook of Microwave Component Measurements

Handbook of Microwave Component Measurements
Author : Joel P. Dunsmore
Publisher : John Wiley & Sons
Release Date : 2012-08-15
Category : Technology & Engineering
Total pages :640
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This book provides state-of-the-art coverage for makingmeasurements on RF and Microwave Components, both active andpassive. A perfect reference for R&D and Test Engineers, withtopics ranging from the best practices for basic measurements, toan in-depth analysis of errors, correction methods, and uncertaintyanalysis, this book provides everything you need to understandmicrowave measurements. With primary focus on active and passivemeasurements using a Vector Network Analyzer, these techniques andanalysis are equally applicable to measurements made with SpectrumAnalyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurementscomplete with extensive definitions and descriptions of componentcharacteristics and measurement parameters. The latterchapters give detailed examples for cases of cable, connector andfilter measurements; low noise, high-gain and high power amplifiermeasurements, a wide range of mixer and frequency convertermeasurements, and a full examination of fixturing, de-embedding,balanced measurements and calibration techniques. The chapter ontime-domain theory and measurements is the most complete treatmenton the subject yet presented, with details of the underlyingmathematics and new material on time domain gating. As the inventorof many of the methods presented, and with 30 years as adevelopment engineer on the most modern measurement platforms, theauthor presents unique insights into the understanding of modernmeasurement theory. Key Features: Explains the interactions between the device-under-test (DUT)and the measuring equipment by demonstrating the best practices forascertaining the true nature of the DUT, and optimizing the time toset up and measure Offers a detailed explanation of algorithms and mathematicsbehind measurements and error correction Provides numerous illustrations (e.g. block-diagrams forcircuit connections and measurement setups) and practical exampleson real-world devices, which can provide immediate benefit to thereader Written by the principle developer and designer of many of themeasurement methods described This book will be an invaluable guide for RF and microwaveR&D and test engineers, satellite test engineers, radarengineers, power amplifier designers, LNA designers, and mixerdesigners. University researchers and graduate students inmicrowave design and test will also find this book of interest.

Handbook of Microwave Component Measurements

Handbook of Microwave Component Measurements
Author : Joel P. Dunsmore
Publisher : John Wiley & Sons
Release Date : 2020-05-13
Category : Technology & Engineering
Total pages :840
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Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.

Microwave Measurements, 3rd Edition

Microwave Measurements, 3rd Edition
Author : R.J. Collier,A.D. Skinner
Publisher : IET
Release Date : 2007-01-01
Category : Technology & Engineering
Total pages :484
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The IET has organised training courses on microwave measurements since 1983, at which experts have lectured on modern developments. Their lecture notes were first published in book form in 1985 and then again in 1989, and they have proved popular for many years with a readership beyond those who attended the courses. The purpose of this third edition of the lecture notes is to bring the latest techniques in microwave measurements to this wider audience. The book begins with a survey of the theory of current microwave circuits and continues with a description of the techniques for the measurement of power, spectrum, attenuation, circuit parameters, and noise. Various other areas like measurements of antenna characteristics, free fields, modulation and dielectric parameters are also included. The emphasis throughout is on good measurement practice. All the essential theory is given and a previous knowledge of the subject is not assumed.

The Six-Port Technique with Microwave and Wireless Applications

The Six-Port Technique with Microwave and Wireless Applications
Author : Fadhel M. Ghannouchi,Abbas Mohammadi
Publisher : Artech House
Release Date : 2009
Category : Technology & Engineering
Total pages :236
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One of the main issues in microwave and wireless system design is to ensure high performance with low cost techniques. The six-port technique helps allow for this in critical network design areas. This practical resource offers you a thorough overview the six-port technique, from basic principles of RF measurement based techniques and multiport design, to coverage of key applications, such as vector network analyzers, software defined radio, and radar. The first book dedicated to six-port applications and principles, this volume serves as a current, one-stop guide offering you cost-effective solutions for your challenging projects in the field.

S-Parameters for Signal Integrity

S-Parameters for Signal Integrity
Author : Peter J. Pupalaikis
Publisher : Cambridge University Press
Release Date : 2020-02-06
Category : Technology & Engineering
Total pages :800
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A practical guide to solving signal integrity problems using s-parameters.

Microwave Systems and Applications

Microwave Systems and Applications
Author : Sotirios Goudos
Publisher : BoD – Books on Demand
Release Date : 2017-01-11
Category : Technology & Engineering
Total pages :434
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Microwave systems are key components of every modern wireless communication system. The main objective of this book was to collect as many different state-of-the-art studies as possible in order to cover in a single volume the main aspects of microwave systems and applications. This book contains 17 chapters written by acknowledged experts, researchers, academics, and microwave engineers, providing comprehensive information and covering a wide range of topics on all aspects of microwave systems and applications. This book is divided into four parts. The first part is devoted to microwave components. The second part deals with microwave ICs and innovative techniques for on-chip antenna design. The third part presents antenna design cases for microwave systems. Finally, the last part covers different applications of microwave systems.

Microwave Circuit Modeling Using Electromagnetic Field Simulation

Microwave Circuit Modeling Using Electromagnetic Field Simulation
Author : Daniel G. Swanson,Wolfgang J. R. Hoefer
Publisher : Artech House
Release Date : 2003
Category : Science
Total pages :469
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Annotation This practical "how to" book is an ideal introduction to electromagnetic field-solvers. Where most books in this area are strictly theoretical, this unique resource provides engineers with helpful advice on selecting the right tools for their RF (radio frequency) and high-speed digital circuit design work

RF Measurements of Die and Packages

RF Measurements of Die and Packages
Author : Scott A. Wartenberg
Publisher : Artech House
Release Date : 2002
Category : Technology & Engineering
Total pages :224
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The recent explosion of the RF wireless integrated circuits (IC), coupled with higher operating speeds in digital IC's has made accurate RF testing of IC's vital. This ground-breaking resource explains the fundamentals of performing accurate RF measurements of die and packages. It offers you practical advice on how to use coplanar probes and test fixtures in the lab for RF on-wafer die and package characterization. It also details how to build separate RF test systems for noise, high-power, and thermal testing as well as de-embed the test system's parasitic effects to get the die's RF performance. This book is a handy, practical resource for RFIC and MMIC designers as well as high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.