June 20, 2021

Download Ebook Free Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy
Author : Yasuo Cho
Publisher : Woodhead Publishing
Release Date : 2020-05-20
Category : Technology & Engineering
Total pages :256
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Local Deep Level Transient Spectroscopy Using Super-higher-order Scanning Nonlinear Dielectric Microscopy

Local Deep Level Transient Spectroscopy Using Super-higher-order Scanning Nonlinear Dielectric Microscopy
Author : Anonim
Publisher : Unknown
Release Date : 2016
Category :
Total pages :129
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Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
Author : Marin Alexe,Alexei Gruverman
Publisher : Springer Science & Business Media
Release Date : 2004-04-06
Category : Science
Total pages :282
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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

JJAP

JJAP
Author : Anonim
Publisher : Unknown
Release Date : 2001
Category : Engineering
Total pages :129
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Proceedings of the ... IEEE Conference on Nanotechnology

Proceedings of the ... IEEE Conference on Nanotechnology
Author : Anonim
Publisher : Unknown
Release Date : 2002
Category : Nanotechnology
Total pages :129
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Japanese Journal of Applied Physics

Japanese Journal of Applied Physics
Author : Anonim
Publisher : Unknown
Release Date : 2006
Category : Physics
Total pages :129
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IEICE Transactions on Electronics

IEICE Transactions on Electronics
Author : Anonim
Publisher : Unknown
Release Date : 2005
Category : Electronics
Total pages :129
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17th IEEE international conference on micro electro mechanical systems

17th IEEE international conference on micro electro mechanical systems
Author : IEEE International Conference on Micro Electro Mechanical Systems 17, 2004, Maastricht, The Netherlands
Publisher : Unknown
Release Date : 2004
Category :
Total pages :868
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Ferroelectric Thin Films

Ferroelectric Thin Films
Author : Anonim
Publisher : Unknown
Release Date : 2005
Category :
Total pages :129
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Fabrication and Characterization of Electric Field - Induced Resistive Sensor at the End of Scanning Probe Tip

Fabrication and Characterization of Electric Field - Induced Resistive Sensor at the End of Scanning Probe Tip
Author : Anonim
Publisher : Unknown
Release Date : 2006
Category :
Total pages :6
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Fabrication and Characterization of Electrical Field were investigated to develop induced Resistive Sensor at the end of Scanning Probe Tip. The measurement and visual observation of doping profile were performed on Kelvin Prove Force Microscopy (KPFM) & Scanning Nonlinear Dielectric Microscopy (SNDM). NiO Film was fabricated and characterized for Memory Switching applications. Last, effects of Surface Treatment on Work Function & in-plane conductivity of ITO (Indium Tin Oxide) Thin Films were also investigated.

Ferroelectric Thin Films IX

Ferroelectric Thin Films IX
Author : Paul Cameron McIntyre
Publisher : Unknown
Release Date : 2001
Category : Ferroelectric devices
Total pages :517
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Advanced Data Storage Materials and Characterization Techniques: Volume 803

Advanced Data Storage Materials and Characterization Techniques: Volume 803
Author : Materials Research Society. Meeting,Andrei Mijiritskii
Publisher : Unknown
Release Date : 2004-04-28
Category : Computers
Total pages :280
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Journal of the Physical Society of Japan

Journal of the Physical Society of Japan
Author : Anonim
Publisher : Unknown
Release Date : 2004
Category : Physics
Total pages :129
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Ferroelectric Thin Films X: Volume 688

Ferroelectric Thin Films X: Volume 688
Author : Materials Research Society. Meeting
Publisher : Materials Research Society
Release Date : 2002-05
Category : Technology & Engineering
Total pages :424
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This book, the tenth in a highly successful series from the Materials Research Society, presents technical information on ferroelectric thin films from academia, government laboratories, and industry. Substantial progress in several areas of integrated ferroelectric and high-permittivity device technology are demonstrated. In particular, the latest developments in high-density FeRAM devices are reviewed, as are developments in the use of these films in piezoelectric, pyroelectric, tunable RF, integrated capacitor, and optical waveguide applications. Thin-film processing techniques used to deposit a variety of ferroelectric and electrode materials are also highlighted, and recent advances in the fundamental understanding of ferroelectricity and degradation phenomena in thin films are addressed. Topics include: processing of Pb-based ferroelectrics; processing of Bi-based ferroelectrics; ferroelectric nonvolatile memories - technology, fundamentals and integration; integration and electrodes; epitaxial ferroelectric films; domains and nanostructures; piezoelectrics and pyroelectrics; ferroelectric gates; thin films for RF applications and high-permittivity materials.

Photorefractive Effects, Materials, and Devices

Photorefractive Effects, Materials, and Devices
Author : Anonim
Publisher : Unknown
Release Date : 2005
Category : Electrooptics
Total pages :129
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